分析探針台XD-100

XB-200或者XB-300或者XD-100或者XD-150或者XD-200或者XD-300配體視顯微鏡

XB-200或者XB-300或者XD-100或者XD-150或者XD-200或者XD-300配金相顯微鏡

Specification
Vacuum Chuck 4" 
Huged-Knob Chuck Stage 
Chuck stage 4"×4" Travel 
Chuck Theta 0°~30°
Chuck Up/Down 4mm Adjustable
Microscope Stage 2"×2" Travel
Platen Up/Down 6mm Adjustable/Coarse Adjustment/Lever-Driven
Platen Up/Down 25mm Adjustable/Fine Adjustment/Hand wheel-Driven
580mmW x 460mmD x 700mmH With Microscope
Weight 55kg with microscope

Accessories
Microscope Magnification ：1000X
Hot Chuck ：200/300/400℃
Special Chuck Design for RF
CCD and Screen
Micropositioner
Tip Holder
Shielding Box
Vibration Free Table

The Probe Station XD-100 is a dedicated probing solution that comes with everything you need to achieve accurate measurement results in the shortest time, with maximum confidence. The system provides best known methods for I-V/C-V measurements.
Designed for upgradability and extendable with multiple options. The Probe Station XD-100 can be easily reconfigured to meet your future project requirements, such as RF testing and high voltage testing .