分析探針台 XD-300

XB-200或者XB-300或者XD-100或者XD-150或者XD-200或者XD-300配金相顯微鏡

XB-200或者XB-300或者XD-100或者XD-150或者XD-200或者XD-300配體視顯微鏡

Specifications
Vacuum Chuck 12"
Huged-Knob Chuck Stage 
Chuck stage 12"×12" Travel 
Chuck Theta 0°~30°
Microscope Stage 2"×2" Travel
Platen Up/Down 6mm Adjustable/Coarse Adjustment/Lever-Driven
Platen Up/Down 25mm Adjustable/Fine Adjustment/Hand wheel-Driven
920mmW x 660mmD x 700mmH With Microscope
Weight 180kg with microscope 

Accessories
Microscope Magnification ：1000X
Hot Chuck ：200/300℃
Special Chuck Design for RF 
Chuck Up/Down 4mm Adjustable
CCD and Screen
Micropositioner
Tip Holder
Shielding Box
Vibration Free Table

The Probe Station XD-300 is a dedicated probing solution that comes with everything you need to achieve accurate measurement results in the shortest time, with maximum confidence. The system provides best known methods for I-V/C-V measurements.
Designed for upgradability and extendable with multiple options. The Probe Station XD-300 can be easily reconfigured to meet your future project requirements, such as RF testing and high voltage testing .